Method and apparatus for increasing yield

ABSTRACT

Aspects of the disclosure provide an integrated circuit (IC) that is configured to have an increased yield. The IC includes a memory element configured to store a specific value determined based on a characteristic of the IC, and a controller configured to control an input regulator based on the specific value of the IC. The input regulator is operative to provide a regulated input to the IC during operation, such that the IC performance satisfies performance requirement.

INCORPORATION BY REFERENCE

This application is a continuation of U.S. application Ser. No.14/045,462, filed on Oct. 3, 2013, which is a continuation of U.S.application Ser. No. 12/979,724, filed on Dec. 28, 2010, which claimspriority under 35 U.S.C. §119(e) to U.S. Provisional Application No.61/291,517, filed on Dec. 31, 2009, and U.S. Provisional Application No.61/312,863, filed on Mar. 11, 2010. The disclosures of the applicationsreferenced above are incorporated herein by reference in theirentireties.

BACKGROUND

The background description provided herein is for the purpose ofgenerally presenting the context of the disclosure. Work of thepresently named inventors, to the extent the work is described in thisbackground section, as well as aspects of the description that may nototherwise qualify as prior art at the time of filing, are neitherexpressly nor impliedly admitted as prior art against the presentdisclosure.

Semiconductor devices production yield is affected by various factors,such as material contaminations, environmental and process-inducedparticles, process variations, and the like. In an example, processvariations cause integrated circuit (IC) chips to have differentperformance during operation. For example, an IC chip at an edgelocation of a wafer may be slower than an IC chip at a center locationof the same wafer due to non-uniform processing. When the edge IC chipis too slow, the edge IC chip is considered as a defective chip, and isscrapped. In a similar manner, IC chips that are too fast are sometimeconsidered defective and are scrapped.

SUMMARY

Aspects of the disclosure provide an integrated circuit (IC). The ICincludes a memory element configured to store a specific valuedetermined based on a characteristic of the IC, and a controllerconfigured to control an input regulator based on the specific value ofthe IC. The input regulator is operative to provide a regulated input tothe IC.

In an embodiment, the controller is configured to generate a voltagecontrol signal based on the stored value, and to provide the voltagecontrol signal to a voltage regulator. The voltage regulator isconfigured to regulate a supply voltage to the IC based on the voltagecontrol signal.

Further, in an example, the memory element is configured to store afirst value determined based on a speed characteristic, and a secondvalue determined based on a power consumption characteristic of the IC.For example, the memory element is configured to store a lower voltagelimit determined based on the speed characteristic, and an upper voltagelimit determined based on the power consumption characteristic. In anembodiment, the controller includes a monitor circuit configured tomonitor a voltage on the IC during operation, and the controller isconfigured to generate the control signal based on the lower voltagelimit, the upper voltage limit and the monitored voltage.

In another example, the memory element is configured to store a targetvoltage determined based on a speed characteristic and a powerconsumption characteristic of the IC. Then, in an embodiment, thecontroller includes a monitor circuit configured to monitor a voltage onthe IC during operation, and the controller is configured to generatethe control signal based on the target voltage and the monitoredvoltage.

According to an aspect of the disclosure, the controller includes aspeed monitor configured to monitor a speed performance of the IC duringoperation, and the controller is configured to control the inputregulator based on the stored value and the monitored speed performance.

Aspects of the disclosure provide a method for operating an integratedcircuit (IC). The method can be used to improve yield. The methodincludes determining a specific value based on a characteristic of theIC, and storing the specific value in a memory element on the IC. Thespecific value is used to control an operation of the IC.

In an example, the method includes generating a control signal based onthe stored specific value, and providing the control signal to an inputregulator to cause the input regulator to regulate an input to the ICbased on the characteristic of the IC.

To provide the control signal to the input regulator, the methodincludes providing the control signal to a voltage regulator to causethe voltage regulator to regulate a supply voltage to the IC based onthe characteristic of the IC.

To determine the value based on the characteristic of the IC, in anembodiment, the method includes determining a first value based on aspeed characteristic and determining a second value based on a powerconsumption characteristic. For example, the method includes determininga lower voltage limit based on the speed characteristic, and determiningan upper voltage limit based on the power consumption characteristic.Further, the method includes monitoring a voltage on the IC during theoperation, and generating the control signal based on the monitoredvoltage, the lower voltage limit and the upper voltage limit.

In another embodiment, the method includes determining a target voltagebased on a speed characteristic and a power consumption characteristicof the IC, monitoring a voltage on the IC during operation, andgenerating the control signal based on the monitored voltage and thetarget voltage. Further, the method includes monitoring a speedperformance of the IC, and generating the control signal based on thestored value and the monitored speed performance.

Aspects of the disclosure provide an electronic system. The electronicsystem includes an input regulator configured to provide an input basedon a control signal, and an integrated circuit (IC) configured toreceive the input during operation. The IC includes a memory elementconfigured to store a specific value determined based on acharacteristic of the IC, and a controller configured to generate thecontrol signal based on the specific value.

BRIEF DESCRIPTION OF THE DRAWINGS

Various embodiments of this disclosure that are proposed as exampleswill be described in detail with reference to the following figures,wherein like numerals reference like elements, and wherein:

FIG. 1 shows a block diagram of an electronic system example 100according to an embodiment of the disclosure;

FIG. 2 shows a block diagram of an electronic system example 200according to an embodiment of the disclosure;

FIG. 3A shows a block diagram of an electronic system 300A according toan embodiment of the disclosure;

FIG. 3B shows a block diagram of an electronic system 300B according toan embodiment of the disclosure;

FIG. 4A shows a block diagram of an electronic system 400A according toan embodiment of the disclosure;

FIG. 4B shows a block diagram of an electronic system 400B according toan embodiment of the disclosure;

FIG. 5 shows a flow chart outlining a process example 500 for testing anIC chip according to an embodiment of the disclosure;

FIG. 6 shows a flow chart outlining a process example 600 for increasingyield according to an embodiment of the disclosure;

FIG. 7 shows a flow chart outlining a process example 700 for increasingyield according to an embodiment of the disclosure; and

FIG. 8 shows a flow chart outlining a process example 800 for increasingyield according to an embodiment of the disclosure.

DETAILED DESCRIPTION OF EMBODIMENTS

FIG. 1 shows a block diagram of an electronic system example 100according to an embodiment of the disclosure. The electronic system 100includes an integrated circuit (IC) chip 110 coupled with an inputregulator 101. The IC chip 110 includes a memory element 120 storing avalue determined based on a characteristic, such as a speedcharacteristic, a power consumption characteristic, a voltagecharacteristic, and the like, that is specific to the IC chip 110.Further, the IC chip 110 includes a controller 130 that generates acontrol signal based on the stored value, and provides the controlsignal to the input regulator 101. The input regulator 101 regulates aninput to the IC chip 110 based on the control signal. The input can bean electrical input, such as a supply voltage, a current, power, and thelike, and an environmental input, such as a temperature, and the like.The electronic system 100 is suitably configured, such that the inputprovided to the IC chip 110 is a function of the characteristic of theIC chip 110. In an embodiment, according to the characteristic of the ICchip 110, the input is suitably regulated such that the performance ofthe IC chip 110 under the regulated input satisfies a performancerequirement. Thus, the IC chip 110 is considered as a good chip.

The IC chip 110 includes any suitable functional circuits, such ascentral processing unit (CPU) 111, logic circuits 112, a static randomaccess memory (SRAM) 113, and the like. It is noted that the logiccircuits 112 can be digital logic circuits, analog logic circuits, ormixed logic circuits.

Generally, an IC chip has to meet various requirements to be consideredas a good chip. In an embodiment, the IC chip needs to meet a functionalrequirement to have correct functions. In addition, the IC chip needs tomeet a performance requirement, such as a speed performance requirement,a power consumption performance requirement, a combination of the speedperformance requirement and the power consumption performancerequirement, and the like. In an example, the IC chip is used in abattery-powered system having a required clock frequency. The IC chipneeds to meet a speed performance requirement that enables correctoperations using the required clock frequency. Further, the IC chipneeds to meet a power consumption performance requirement to enable arelatively long battery life.

In another example, the IC chip is used in a non-battery powered systemusing a required clock frequency. The non-battery powered system has alimited heat sink. For example, the system is cooled by a relativelysmall fan that has a relatively small cooling capacity. Thus, the ICchip needs to meet a speed performance requirement that enables correctoperations using the required clock frequency. Further, the IC chipneeds to meet a power consumption performance requirement to ensure thatthe IC chip does not overheat by itself nor overheats the system.

The performance of an IC chip depends on inputs, such as electricalinputs, environmental inputs, and the like. In an example, an IC chiphas a relatively slow speed and a relatively low power consumption usinga relatively small supply voltage, and has a relatively fast speed and arelatively high power consumption using a relatively large supplyvoltage. In another example, an IC chip has a relatively fast speed anda relatively low standby power consumption under a relatively lowtemperature, and has a relatively slow speed and a relatively highstandby power consumption under a relatively high temperature.

According to an embodiment of the disclosure, the value stored in thememory element 120 is determined based on the characteristic that isspecific to the IC chip 110. In an example, the value stored in thememory element 120 is indicative of a speed characteristic for the ICchip 110, such as a fast chip, a slow chip, and the like. Further,during the operation of the electronic system 100, the stored value issuitably used to control the provided input by the input regulator 101as a function of the characteristic, such that the performance of the ICchip 110 satisfies the performance requirement.

In an example, the IC chip 110 is considered as a defective chip under ageneral input range, because the IC chip 110 does not always satisfy theperformance requirement for all input values within the general inputrange. According to an embodiment of the disclosure, by regulating aninput, such as a supply voltage to the IC chip 110 as a function of thecharacteristic that is specific to the IC chip 110, performance of theIC chip 110 can be tweaked so that the IC chip 110 meets the performancerequirement. IC chips typically are designed to satisfactorily operateusing the general input range. Some IC chips that meet the performancerequirement in a subset of the input range would normally be scrapped.According to an aspect of the disclosure, those IC chips can be deemed“good enough”, and thus saved, merely by regulating the input so thatonly the subset of the input range that enables a particular IC chip 110to meet its performance requirements is supplied to this particular ICchip 110.

In an example, IC chips are tested according to a generally providedsupply voltage in the range of [0.9V, 1.1V]. The IC chip 110 does notalways satisfy a performance requirement, such as a speed performancerequirement, under the generally provided supply voltage in the fullrange of [0.9V, 1.1V]. In an example, the IC chip 110 satisfies thespeed performance requirement when the provided supply voltage is in therange of [0.95V, 1.1V] and does not satisfy the speed performancerequirement when the provided supply voltage is in the range of [0.9V,0.95V]. Thus, the IC chip 110 is considered as a defective chip underthe generally provided supply voltage, and is counted in yield loss.

According to an embodiment of the disclosure, the memory element 120stores a value determined based on the characteristic, such as theinherent speed characteristic, that is specific to the IC chip 110. Forexample, the stored value is indicative of a slow chip that onlysatisfies a specified performance requirement when the supply voltage isin the range of [0.95V, 1.1V]. Then, when the IC chip 110 is used in theelectronic system 100, the stored value is suitably used for regulatingthe supply voltage to be only within the range of [0.95V, 1.1V], suchthat the IC chip 110 always satisfies the performance requirement. Thus,the IC chip 110 can be considered as a good chip instead of a defectivechip, and the product yield increases.

FIG. 2 shows a block diagram of an electronic system example 200according to an embodiment of the disclosure. The electronic system 200includes an integrated circuit (IC) chip 210 coupled with a voltageregulator 201A. The IC chip 210 includes an IC domain-A 211A, a memoryelement 220A storing a value determined based on a characteristic thatis specific to the IC domain-A 211A. Further, the IC chip 210 includes acontroller 230A that generates a control signal based on the storedvalue, and provides the control signal to the voltage regulator 201A tocontrol regulation of voltage input to IC chip 210. The voltageregulator 201A generates the supply voltage VDD-A based on the controlsignal and provides the supply voltage VDD-A to the IC domain-A 211A.The electronic system 200 is suitably configured such that the supplyvoltage VDD-A is a function of the characteristic that is specific tothe IC domain-A 211A.

In an embodiment, the IC domain-A 211A needs to have correct functionsand meet performance requirement, such as a speed performancerequirement and/or a power consumption performance requirement, to beconsidered as good circuit. The speed and the power consumption dependon the supply voltage VDD-A. In an example, when the supply voltageVDD-A is relatively low, the IC domain-A 211A has a relatively slowspeed performance and a relatively low power consumption performance;and when the supply voltage VDD-A is relatively high, the IC domain-A211A has a relatively fast speed performance and a relatively high powerconsumption performance.

In an example, a generally provided supply voltage is in the range of[0.9V, 1.1 V]. When the IC domain-A 211A does not always satisfy thespeed performance requirement and the power consumption performancerequirement under the generally provided supply voltage, the IC domain-A211A is considered as a defective IC domain, and the IC chip 210 isconsidered as a defective chip. For example, the IC domain-A 211Asatisfies the speed performance requirement when the provided supplyvoltage is in the range of [0.95V, 1.1V] and does not satisfy the speedperformance requirement when the provided supply voltage is in the rangeof [0.9V, 0.95V]. Then, in this example the IC chip 210 would beconsidered as a defective IC under the generally provided supplyvoltage, and is counted in yield loss, because in the example the ICdomain-A 211A fails to meet the specified speed performance requirementwhen the supply voltage is within the range of [0.9V, 0.95V]. Further,in another example, the IC domain-A 211A satisfies the power consumptionperformance requirement when the provided supply voltage is in the rangeof [0.9V, 1.05V], and does not satisfy the power consumption performancerequirement when the provided supply voltage is in the range of [1.05V,1.1V]. Then, in this example, the IC chip 210 would be considered as adefective IC under the generally specified supply voltage, and iscounted in yield loss, because in the example the IC domain-A 211A failsto meet specified power consumption performance requirement when thesupply voltage is within the range of [1.05V, 1.1V].

According to an embodiment of the disclosure, the memory element 220Astores a first value determined based on a speed characteristic and asecond value determined based on a power consumption characteristic. Inan example, the first value indicates that the IC domain-A 211A is aslow IC domain that satisfies the speed performance requirement when theprovided supply voltage is in the range of [0.95V, 1.1V], and the secondvalue indicates that the IC domain-A 211A satisfies the powerconsumption performance requirement in the entire supply voltage range.Then, during operation, the controller 230A generates the control signalbased on the first value and the second value. The control signal isprovided to the voltage regulator 201A. The voltage regulator 201Aprovides the supply voltage VDD-A based on the control signal, such thatthe provided supply voltage VDD-A is in the range of [0.95V, 1.1V].Thus, the IC domain-A 211A satisfies the speed performance requirementand the power consumption performance requirement. As a result, the ICdomain-A 211A is considered as a good IC domain instead of a defectiveIC domain.

In another example, the first value indicates that the IC domain-A 211Asatisfies the speed performance requirement in the entire voltage range,and the second value indicates that the IC domain-A 211A is a leaky ICdomain that satisfies the power consumption performance requirement whenthe provided supply voltage is in the range of [0.9V, 1.05V], forexample. Then, during operation, the controller 230A generates thecontrol signal based on the first value and the second value. Thecontrol signal is provided to the voltage regulator 201A. The voltageregulator 201A provides the supply voltage VDD-A based on the controlsignal, such that the provided supply voltage VDD-A is in the range of[0.9V, 1.05V]. Thus, the IC domain-A 211A satisfies the speedperformance requirement and the power consumption performancerequirement during operation. As a result, the IC domain-A 211A isconsidered as a good IC domain instead of a defective IC domain.

In an embodiment, the voltage regulator 201A is a digital voltageregulator. The controller 230A generates a digital control signal basedon the stored value, and provides the digital control signal to thevoltage regulator 201A.

In another embodiment, the voltage regulator 201A is an analog voltageregulator. The controller 230A generates an analog control signal basedon the stored value, and provides the analog control signal to thevoltage regulator 201A. A suitable controller generating an analogcontrol signal for controlling a voltage regulator is disclosed inAssignee's co-pending application 12/730,829, filed Mar. 24, 2010, whichis incorporated herein by reference in its entirety.

It is noted that, in an embodiment, the IC chip 210 includes multipleintegrated circuit domains that are coupled to respective voltageregulators. In the FIG. 2 example, the IC chip 210 also includes an ICdomain-B 211B coupled to a voltage regulator 201B. The voltage regulator201B controls the supply voltage VDD-B to the IC domain-B 211B. In anembodiment, the IC chip 210 includes a first power grid (not shown) forproviding the supply voltage to circuits in the IC domain-A 211A and asecond power grid (not shown) for providing supply voltage to circuitsin the IC domain-B 211B.

Further, the IC chip 210 includes a memory element 220B storing a valuedetermined based on a characteristic that is specific to the IC domain-B211B. Also, the IC chip 210 includes a controller 230B that generates acontrol signal based on the stored value in the electronic element 220B,and provides the control signal to the voltage regulator 201B. Based onthe control signal, the voltage regulator 201B controls the supplyvoltage VDD-B to the IC domain-B 211B.

It is noted that, in an example, the first set including the memoryelement 220A, the controller 230A and the voltage regulator 201A, andthe second set including the memory element 220B, the controller 230B,and the voltage regulator 201B operate independently from each other.

FIG. 3A shows a block diagram of an electronic system 300A according toan embodiment of the disclosure. The electronic system 300A includes anintegrated circuit (IC) chip 310A coupled with a voltage regulator 301A.The IC chip 310A includes a memory element 320A storing valuesdetermined based on general characteristics and characteristics that arespecific to the IC chip 310A. Further, the IC chip 310A includes avoltage controller 330A that generates a voltage control signal based onthe stored values, and provides the voltage control signal to thevoltage regulator 301A. The voltage regulator 301A regulates the supplyvoltage VDD based on the voltage control signal and provides the supplyvoltage VDD to the IC chip 310A. The electronic system 300 is suitablyconfigured such that the supply voltage VDD is a function of thecharacteristics that are specific to the IC chip 310A according to thevalues that are determined based on these characteristics and that arestored in memory element 320A.

In the FIG. 3A example, the voltage controller 330A includes a monitorcircuit 331A monitoring a parameter during operation. In an example, themonitor circuit 331A is configured to monitor a voltage on the IC chip310A during operation. In another example, the monitor circuit 331A isconfigured to monitor a frequency of an oscillator on the IC chip 310Aduring operation. The monitored parameter is used to dynamicallyregulate the supply voltage VDD to the IC chip 310A. In an embodiment,the voltage controller 330A and the voltage regulator 301A are suitablycoupled to form a feedback loop. Specifically, the monitored parameteris a function of the provided supply voltage. The voltage controller330A generates the voltage control signal based on the monitoredparameter. Then, the voltage control signal is used by the voltageregulator 301A to regulate the provided supply voltage.

In the FIG. 3A example, the memory element 320A stores a first value321A that corresponds to a maximum permissible voltage value of agenerally provided supply voltage, a second value 322A that correspondsto a minimum permissible voltage value of the generally provided supplyvoltage, a third value 323A that is an upper limit for the parametermonitored by the monitor circuit 331A, and a fourth value 324A that is alower limit for the parameter monitored by the monitor circuit 331A.

In an example, the first value 321A and the second value 322A are hardlimits that are specified for ICs of a same product. Thus, in anexample, the first value 321A and the second value 322A are hard codedin the design. The third value 323A and the fourth value 324A arespecific to the IC chip 310A, and are determined based oncharacteristics of the IC chip 310A. In an example, the third value 323Aand the fourth value 324A are determined based on suitable testing ofthe IC chip 310A, and then are stored in One-Time Programmable (OTP)memories after the testing. It is noted that the OTP memories can beimplemented by any suitable techniques, such as fuse links, floatinggate non-volatile memory, and the like.

Further, the voltage controller 330A generates a voltage control signalbased on the stored values and the monitored parameter. In anembodiment, the monitoring circuit 331A monitors a voltage on the ICchip 310A. The third value 323A is an upper voltage limit of themonitored voltage, and is determined based on a power consumptioncharacteristic of the IC chip 310A. For example, when the third value323A is smaller than the first value 321A, the IC chip 310A is a leakychip. Thus, when the monitored voltage is larger than the third value323A, the power consumption of the circuits in the IC chip 310A does notsatisfy the power consumption performance requirement. The fourth value324A is a lower voltage limit of the monitored voltage, and isdetermined based on a speed characteristic of the IC chip 310A. Forexample, when the fourth value 324A is larger than the second value322A, the IC chip 310A is a slow chip. Thus, when the monitored voltageis lower than the fourth value 324A, the speed of the circuits in the ICchip 310A does not satisfy the speed performance requirement. Then, inan embodiment, the voltage controller 330A suitably generates thecontrol signal based on the stored values 321A-324A to keep the supplyvoltage within the range defined by 321A and 322A, and to keep themonitored voltage within the range defined by 323A and 324A.

In another embodiment, the monitor circuit 331A monitors a speed ofspeed monitoring circuit. In an example, the monitor circuit 331Aincludes an oscillator that generates a digital value that is indicativeof a speed of circuits on the IC chip 310A during operation. The thirdvalue 323A is an upper limit of the digital value, and is determinedbased on a power consumption characteristic of the IC chip 310A. Forexample, when the monitored speed is larger than the third value 323A,the power consumption of the circuits in the IC chip 310A does notsatisfy the power consumption performance requirement. The fourth value324A is a lower limit of the digital value, and is determined based on aspeed characteristic of the IC chip 310A. For example, when themonitored speed is lower than the fourth value 324A, the speed of thecircuits in the IC chip 310A does not satisfy the speed performancerequirement. Then, in an embodiment, the voltage controller 330Asuitably generates the control signal based on the stored values321A-324A to keep the digital value from the monitor circuit 331A withinthe range defined by 323A and 324A, and to keep the supply voltagewithin the range defined by 321A and 322A.

FIG. 3B shows a block diagram of an electronic system 300B according toan embodiment of the disclosure. The electronic system 300B utilizescertain components that are identical or equivalent to those used in theelectronic system 300A; the description of these components has beenprovided above and will be omitted here for clarity purposes. However,in this embodiment, the memory element 320B stores a third value 323Bthat is a target value for the parameter monitored by the monitorcircuit 331B. In an example, the third value 323B is determined based onthe speed characteristic and the power consumption characteristic, andthen is stored in OTP memory on the IC chip 310B.

Further, the voltage controller 330B generates a voltage control signalbased on the stored values and the monitored parameter. In anembodiment, the monitor circuit 331B includes an oscillator thatgenerates a digital value that is indicative of a speed performance ofcircuits on the IC chip 310B during operation. The third value 323B is atarget value of the digital value, at which, the speed performance andthe power consumption performance of the IC chip 310B respectivelysatisfy the speed performance requirement and the power consumptionperformance requirement. Then, in an embodiment, the voltage controller330B suitably generates the voltage control signal based on the storedvalues 321B-323B to keep the monitored speed at the target value 323B,and to keep the supply voltage within the range defined by the storedvalues 321B-322B.

It is noted that the functions of the voltage controller can beimplemented by dedicated controller, or can be added into an existingvoltage controller, such as an Adaptive Voltage Scaling (AVS) modulethat already exists in some products.

FIG. 4A shows a block diagram of an electronic system 400A according toan embodiment of the disclosure. The electronic system 400A alsoutilizes certain components that are identical or equivalent to thoseused in the electronic system 300A; the description of these componentshas been provided above and will be omitted here for clarity purposes.However, in this embodiment, the voltage controller is implemented usingan existing circuit module—an AVS module 430A. The AVS module 430Aincludes a process monitor 431A, a logic circuit 432A and a voltageadjustor 433A. These elements are coupled together as shown in FIG. 4A.

The process monitor 431A monitors a parameter during operation. Theparameter is affected by process variations, and also depends on thesupply voltage VDD provided by the voltage regulator. The memory element420A stores a third value 423A that is an upper limit for the parametermonitored by the process monitor 431A, and a fourth value 424A that is alower limit for the parameter.

The monitored parameter is provided to the logic circuit 432A. The logiccircuit 432A is suitably implemented to generate an adjustment signalbased on the monitored parameter and values stored in the memory element420A, and provide the adjustment signal to the voltage adjustor 433A.The voltage adjustor 433A adjusts a voltage feedback signal based on theadjustment signal, and outputs the voltage feedback signal to thevoltage regulator 401A. Then, the voltage regulator 401A regulates thesupply voltage VDD to the IC chip 410A.

FIG. 4B shows a block diagram of an electronic system 400B according toan embodiment of the disclosure. The electronic system 400B utilizescertain components that are identical or equivalent to those used in theelectronic system 400A; the description of these components has beenprovided above and will be omitted here for clarity purposes. However,in this embodiment, the memory element 420B stores a third value 423Bthat is a target value for the parameter monitored by the processmonitor 431B. In an example, the third value 423B is determined based onthe speed characteristic and the power consumption characteristic of theIC chip 410B, and then is stored in OTP memory on the IC chip 410B.

Further, the voltage controller 430B generates a voltage control signalbased on the stored values and the monitored parameter. In anembodiment, the process monitor 431B includes an oscillator thatgenerates a digital value that is indicative of a speed of circuits onthe IC chip 410B during operation. The third value 423B is a targetvalue of the digital value, at which, the speed performance and thepower consumption performance of the IC chip 410B respectively satisfythe speed performance requirement and the power consumption performancerequirement. Then, in an embodiment, the logic circuits 432B suitablygenerates the adjustment signal based on the stored values 421B-423B tokeep the monitored speed at the target value defined by the stored value423B, and to keep the supply voltage within the range defined by thestored values 421B-422B.

FIG. 5 shows a flow chart outlining a process example for testing an ICchip according to an embodiment of the disclosure. It is noted that, inan embodiment, the IC chip is within a suitable package, and the packageis suitably tested. In another embodiment, the IC chip is still on awafer, and the IC chip is suitably tested by a wafer test. The processstarts at S501 and proceeds to S510.

At S510, a first tester performs functional tests on the IC chip.

At S520, the tester determines whether the IC chip passes the functionaltests. When the IC chip passes the functional test, the process proceedsto S530; otherwise, the process proceeds to S560.

At S530, a second tester performs tests to determine a characteristic ofthe IC chip. It is noted that the second tester can be the same testeras the first tester or can be a different tester from the first tester.In an embodiment, the IC chip includes process monitor that is tested todetermine the characteristic. In another embodiment, a suitable processmonitor is in a scribe line that is next to the IC chip. The processmonitor is tested to determine the characteristic of the IC chip. In anexample, a process monitor includes a ring oscillator. The ringoscillator is suitably tested to determine a speed characteristic of theIC chip. In another example, a process monitor includes devicestructures, such as transistors, and the like, that can be suitablytested to determine various device parameters, such as threshold,sub-threshold current, and the like. Based on the device parameters, thecharacteristic, such as speed characteristic, power consumptioncharacteristic, and the like, is suitably determined.

At S540, the second tester, or any other suitable controller, determineswhether valid inputs exist for the characteristic. In an example, thesecond tester determines whether supply voltages that make the IC chiphaving the characteristic meet the speed performance requirement andpower consumption performance requirement are in the range defined bythe hard coded minimum and maximum voltage values. When valid inputsexist, the process proceeds to S550; otherwise, the process proceeds toS560.

At S550, one or more values determined based on the characteristic ofthe IC chip are stored in a memory element on the IC chip. In anembodiment, the memory element includes a One Time Programmable (OTP)memory that is programmed to store the values. It is noted that thevalues can be suitably determined to correspond to any suitableparameters to simplify further operation. In an example, the IC chipincludes an on-chip speed monitor to monitor a speed performance, andthen a speed target value that is determined based on a speedcharacteristic and a power consumption characteristic of the IC chip isstored in the memory element on the IC chip. In another example, the ICchip includes an on-chip voltage monitor, and thus an upper voltagelimit determined based on a power consumption characteristic of the ICchip and a lower voltage limit determined based on a speedcharacteristic of the IC chip are stored in the memory element on the ICchip. The process then proceeds to S599 and terminates.

At S560, the IC chip is scrapped, and the process proceeds to S599 andterminates.

It is noted that the process 500 can be suitably modified. In anexample, a parametric tester tests device structures in a scribe linethat is next to the IC chip before the functional test. The parametrictest results, such as threshold, sub-threshold current, and the like arestored in association with the IC chip in a data base for parametrictest. After the functional test, the stored parametric test results areretrieved and used to determine the characteristic of the IC chip.

FIG. 6 shows a flow chart outlining a process example 600 for increasingyield according to an embodiment of the disclosure. The process 600 is adetailed example of S530-S560 in FIG. 5. In the example, an IC chipincludes a speed monitor that monitors a speed of circuits in the ICchip during operation. It is noted that the speed is affected by processvariations and also affected by inputs, such as supply voltage,temperature, and the like. The process starts at S601 and proceeds toS610.

At S610, limits for the speed monitored by the on-chip speed monitor areinitialized. In an example, a lower limit of the speed performancemonitored by the speed monitor is determined according to minimum speedperformance requirement and statistical data of previous measurement;and an upper limit of the speed is determined according to maximum powerconsumption performance requirement and the statistical data of previousmeasurement.

At S620, the tester applies an initial voltage on the IC chip, andmeasures a speed value of the speed monitor. It is noted that duringthis test, the voltage provided to the IC chip is not regulated based onthe voltage control signal from the IC chip, but is controlled by thetester. In an example, the initial voltage is a medium voltage in ageneral voltage range, such as 1V of a general voltage range of [0.9V,1.1V].

At S630, the tester determines whether the measured speed value falls inthe range defined by the limits. When the measured speed value is withinthe range, the process proceeds to S670; otherwise, the process proceedsto S640.

At S640, the tester tests the IC chip to determine whether validvoltages that make the IC chip to satisfy the speed performancerequirement and the power consumption performance requirement exist. Inan example, the tester searches up from the medium voltage or searchesdown from the medium voltage to find a voltage under which the measuredspeed value falls in the range defined by the limits, and checks whetherthe voltage is within the permissible voltage range. In an embodiment,the voltage is indicative of characteristics of the IC chip. Forexample, when the voltage is larger than the medium voltage, the IC chipis a slow chip, and when the voltage is smaller than the medium voltage,the IC is a leaky chip. When the voltage is in the permissible range,the process proceeds to S650; otherwise, the process proceeds to S680.

At S650, the tester determines a lower limit of the on-chip speedmonitor based on the speed characteristic. It is noted that, in anexample, the tester determines the lower limit based on the foundvoltage in S640. In another example, the tester determines the lowerlimit based on additional test results, such as test results of devicestructures in the scribe line or in a test die.

At S660, the tester determines an upper limit of the on-chip speedmonitor corresponding to the power consumption characteristic. It isnoted that, in an example, the tester determines the upper limit basedon the found voltage in S640. In another example, the tester determinesthe upper limit based on additional test results, such as test resultsof device structures in the scribe line or in a test die.

At S670, the lower limit and the upper limit are stored on the IC chip.In an embodiment, the lower limit and the upper limit are stored in OTPmemory on the IC chip. The process then proceeds to S699, andterminates.

At S680, the IC chip is scrapped and the process proceeds to S699 andterminates.

In a comparison test example, in S630, when the measured speed valuedoes not fall in the range defined by the limits, the IC chip isscrapped due to the reason the IC chip does not always satisfy the speedperformance requirement and the power consumption performancerequirement using the generally provided supply voltage. However, inFIG. 6 example, the IC chip is further tested to determine whether thesupply voltage can be controlled based on the characteristic of the ICchip to make the IC satisfy the speed performance requirement and thepower consumption performance requirement. When such supply voltageexists, the IC chip is considered as a good chip, and can be used in anelectronic system, such as the electronic system 200. By this method, aportion of IC chips that are considered as defective chips in thecomparison test example, are now considered as good chip, and thenproduct yield is increased.

FIG. 7 shows a flow chart outlining a process example 700 for increasingyield according to an embodiment of the disclosure. The process 700shows a detailed example of S530-S560 in FIG. 5. In the example, an ICchip includes a speed monitor that monitors a speed of circuits in theIC chip during operation. It is noted that the speed is affected byprocess variations and also affected by inputs, such as supply voltage,temperature, and the like. The process starts at S701 and proceeds toS710.

At S710, a target speed value for the on-chip speed monitor isinitialized. In an example, a target speed value is determined accordingto the speed performance requirement and statistical data of previousmeasurement. In addition, a maximum current is determined according tothe power consumption performance requirement. In an example, themaximum current is a sum of the maximum allowed leakage and dynamiccurrent.

At S720, the tester searches for a voltage that allows the speed valueof the speed monitor matches the target speed value. In an example, thetester steps up from a minimum voltage value of a general supply voltagerange, such as 0.9V of a general supply voltage range of [0.9V, 1.1V],until the speed value of the speed monitor matches or exceeds the targetspeed value. In another example, the tester steps down from a maximumvoltage value of a general supply voltage range, such as 1.1V of ageneral supply voltage range of [0.9V, 1.1V], until the speed value ofthe speed monitor matches the target speed value or the lower voltagelimit is reached. It is noted that during this test, the voltageprovided to the IC chip is not regulated based on the voltage controlsignal from the IC chip, but is controlled by the tester.

At S730, the tester determines whether the obtained voltage in S720 isvalid. In an example, the tester determines whether the obtained voltageis in the range of the generally provided supply voltage. When theobtained voltage is in the range, the process proceeds to S740;otherwise, the process proceeds to S780.

At S740, the tester measures a current of the IC chip.

At S750, the tester determines whether the measured current is largerthan the maximum current. When the measured current is larger than themaximum current, the process proceeds to S780; otherwise the processproceeds to S760.

At S760, the tester adjusts the target speed value considering the powerconsumption characteristic of the IC chip, such as the measured currentof the IC chip. It is noted that, in an example, the tester adjusts thetarget speed value based on additional test results, such as testresults of device structures in the scribe line or in a test die. In anexample, the tester adjusts the target speed value to allow the IC chipto operate with suitable margins to the speed performance requirementand the power consumption performance requirement.

At S770, the target speed value is stored on the IC chip. In an example,the target speed value is stored in an OTP memory on the IC chip. Theprocess then proceeds to S799 and terminates.

At S780, the IC chip is scrapped. The process then proceeds to S799 andterminates.

It is noted that the process 700 can be suitably modified. In anembodiment, S760 is skipped. In an example, at S710, the target speedvalue is initialized based on characteristics of the IC chip. Forexample, the target speed value is initialized based on a position ofthe IC chip on a wafer. In another example, the target speed value isinitialized based on a parametric measurement of a test structure thatis in a scribe line next to the IC chip. Then, S760 is skipped.

FIG. 8 shows a flow chart outlining a process example 800 for increasingyield according to an embodiment of the disclosure. The process 800shows a detailed example of S530-S560 in FIG. 5. In the example, an ICchip includes a voltage monitor that monitors a voltage on the IC chipduring operation. The process starts at S801 and proceeds to S810.

At S810, an upper voltage limit and a lower voltage limit for thevoltage monitor is initialized. In an example, the upper voltage limitand the lower voltage limit are determined according to hard-codedvoltage limits. For example, the upper voltage limit is initialized tobe the maximum permissible voltage value of a generally provided supplyvoltage, and the lower voltage limit is initialized to be a minimumpermissible voltage value of the generally provided supply voltage.

At S820, a tester reduces the upper voltage limit and applies a supplyvoltage according to the reduced upper voltage limit to the IC chip totest the power consumption performance of the IC chip. This step repeatsuntil the power consumption performance satisfies the power consumptionperformance requirement for the IC chip.

At S830, the tester increases the lower voltage limit and applies asupply voltage according to the increased lower voltage limit to the ICchip to test the speed performance of the IC chip. This step repeatsuntil the speed performance satisfies the speed performance requirementfor the IC chip.

At S840, the tester determines whether the reduced upper voltage limitis still greater than the increased lower voltage limit. When the uppervoltage limit is still greater than the lower voltage limit, the processproceeds to 850; otherwise, the process proceeds to S860.

At S850, the upper voltage limit and the lower voltage limit are storedon the IC chip. In an example, the upper voltage limit and the lowervoltage limit are stored in OTP memory on the IC chip. The process thenproceeds to S899 and terminates.

At S860, the IC chip is scrapped. The process then proceeds to S899 andterminates.

It is noted that the process 800 can be suitably modified. In anexample, at S850, instead of storing the upper voltage limit and thelower voltage limit, an average of the upper voltage limit and the lowervoltage limit is stored on the IC as a target voltage value.

While the invention has been described in conjunction with the specificembodiments thereof that are proposed as examples, it is evident thatmany alternatives, modifications, and variations will be apparent tothose skilled in the art. Accordingly, embodiments of the invention asset forth herein are intended to be illustrative, not limiting. Thereare changes that may be made without departing from the scope of theinvention.

1. An integrated circuit (IC), comprising: one or more first memoryelements configured to store one or more specific value indicative of alower voltage limit and of an upper voltage limit, for operation of theIC; one or more second memory elements configured to store one or morespecific values indicative of one or more target performance parametersof the IC; and a controller configured to adjustably control an inputvoltage that is input to the IC to be within a range of voltagesdetermined by the specific value for voltage limits stored in the one ormore first memory elements, such that operation of the IC meets orexceeds target performances corresponding to the specific valuesindicative of the one or more target performance parameters stored inthe one or more second memory elements.
 2. The IC of claim 1, wherein avalue stored in one of the one or more second memory elementscorresponds to a speed above which the IC must operate.
 3. The IC ofclaim 1, wherein a value stored in one of the one or more second memoryelements corresponds to a power consumption below which the IC mustoperate.
 4. The IC of claim 1, wherein the controller is configured toadjustably control the input voltage so that the IC meets or exceeds allthe target performance parameters corresponding to the specific valuesstored in the one or more second memory elements.
 5. The IC of claim 1,further comprising: a regulator configured to supply to the IC aregulated input voltage responsively to a feedback signal, wherein thecontroller is configured to generate the feedback signal based on ameasured performance of the IC, and to provide the feedback signal tothe regulator.
 6. The IC of claim 5, wherein the feedback signal of thecontroller is a signal indicative of an amount of adjustment in theregulated input voltage supplied to the IC by the regulator.
 7. The ICof claim 5, wherein the performance corresponds to a speed of the IC. 8.The IC of claim 1, wherein the controller further comprises a monitorcircuit configured to monitor a voltage on the IC during operation, andthe controller is further configured to generate a feedback signal basedon whether the monitored voltage is within the lower and upper voltagelimits such that operation of the IC meets or exceeds the targetperformance parameters.
 9. The IC of claim 1, wherein the one or morefirst memory elements are configured to store a target voltagedetermined based on an average of lower and upper voltage limits foroperating the IC.
 10. The IC of claim 9, wherein the controller furthercomprises a monitor circuit configured to monitor a voltage on the ICduring operation, and the controller is further configured to generate afeedback signal based on whether the monitored voltage substantiallycorresponds to the target voltage such that operation of the IC meets orexceeds the target performance parameters.
 11. A method for operating anintegrated circuit (IC), comprising: storing a specific value in one ormore first memory elements, the specific value being indicative of alower voltage limit and of an upper voltage limit, for operation of theIC; storing one or more specific values in one or more second memoryelements, the one or more specific values being indicative of one ormore target performance parameters of the IC; and adjustablycontrolling, by a controller, an input voltage that is input to the ICto be within a range of voltages determined by the specific value forvoltage limits stored in the one or more first memory elements, suchthat operation of the IC meets or exceeds target performancescorresponding to the specific values indicative of the one or moretarget performance parameters stored in the one or more second memoryelements.
 12. The method of claim 11, further comprising: operating theIC with a speed corresponding to a value stored in one of the one ormore second memory elements, the speed determined by a required clockfrequency of the IC.
 13. The method of claim 11, further comprising:operating the IC with a power consumption below a value stored in one ofthe one or more second memory elements, the power consumption determinedby one of a life of a battery used to operate the IC, an amount of heatgenerated by the IC, and a sum of the maximum allowed leakage anddynamic current.
 14. The method of claim 11, further comprising:outputting a feedback signal to a regulator so that an input voltagesupplied to the IC by the regulator causes the IC to meet or exceed thetarget performance parameters corresponding to the one or more specificvalues stored in the one or more second memory elements; monitoring avoltage on the IC during operation; and determining whether themonitored voltage is within voltage limits determined by the specificvalue stored in the one or more first memory elements.
 15. The method ofclaim 14, further comprising: adjusting, based on the feedback signal,an amount of the input voltage supplied to the IC by the regulator. 16.The method of claim 14, wherein one of the target performance parameterscorresponds to a speed of the IC.
 17. The method of claim 11, furthercomprising: adjusting the input voltage using a feedback signal untilthe IC meets or exceeds all the target performance parameterscorresponding to the specific values stored in the one or more secondmemory elements while monitoring a voltage on the IC during operationand maintaining the monitored voltage within voltage limits determinedby the specific value stored in the one or more first memory elements.18. The method of claim 11, further comprising: monitoring a voltage onthe IC during operation; and generating a feedback signal based onwhether the monitored voltage is within the lower and upper voltagelimits such that operation of the IC meets or exceeds the targetperformance parameters.
 19. The method of claim 11, further comprising:averaging lower and upper voltage limits for operating the IC as atarget voltage; and storing the target voltage in the one or more firstmemory elements.
 20. The method of claim 19, further comprising:monitoring a voltage on the IC during operation; and generating afeedback signal based on whether the monitored voltage substantiallycorresponds to the target voltage such that operation of the IC meets orexceeds the target performance parameters.